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ABDULLAH, FAHD, SFO TECHNOLOGIESAbou-Zeid, Ahmed, Physikalisch-Technische Bundesanstalt (PTB)
Acosta, Juan Camilo, ISIR, UPMC
Akselli, Basak, TUBITAK UME
Altiner, Baris, YILDIZ TECHNICAL UNIVERSITY
Altuğ, Erdinç, Istanbul Technical University
ANDRON, VOYTEK, MICROVISION INC.
AUGUSTINE, ROBIN, SFO TECHNOLOGIES
b
bai, yanhuiB
Baroud, Charles N, Ecole PolytechniqueBehr, Bradford, University of Waterloo
Bellini, Nicola
Bellouard, Yves
Ben Amara, Foued, University of Toronto
Bodendorfer, Thomas, Technische Universität München, Institute for Measurement Systems and Sensor Technology
Braun, Dieter, LMU München
Braxmaier, Claus
Braxmaier, Claus, Hochschule Konstanz
Broistedt, Hagen, Institut für Produktionsmesstechnik, Technische Universität Braunschweig
Buck, Thorbjörn C., Technische Universität München
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Camisani-Calzolari, Fernando R., CSIR, South AfricaCastillo, Luis E, Department of Electrical Engineering, Universidad de Chile
Cenko, Andrew, University of Waterloo
Cerullo, Giulio
Cha, Dong Hyuk, Korea Polytechnic University
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